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Description
Applications: Academic, Chemicals, Food & Beverage, Chemicals Environmental, Industrial QA/QC, Material Science, Pharmaceuticals
Evolution Pro UV-Vis Spectrophotometers:
- Rely on the double beam optical design providing outstanding reliability, precision performance, and long-term stability for the most demanding applications.
- Optimized performance for advanced testing requirements and peak resolution capabilities with selectable bandwidths of 0.5, 1.0, 1.5, 2.0 and 4.0 nm.
- Ensure accuracy of your data with optional Calibration Validation Carousel (CVC) for automated performance verification.
- Get instant measurements and excellent performance over entire wavelength range of 190-1100 nm with xenon flash lamp.
Move from samples to answer faster:
- Easily go from sample to final report - with intuitive INSIGHT Pro Software guiding you every step of the way.
- Obtain results you need for quantitative analysis, scanning and kinetics applications with comprehensive software tools for data collection, processing, and reporting.
- Customize even complex methods with ease using workflow-oriented application modules.
- Enforce data security with optional INSIGHT Pro Security Software tools to assist with achieving current 21 CFR Part 11 compliance in your pharmaceutical lab.
Enhance productivity with sampling flexibility:
- Speed up your analysis with Thermo Scientific™ Smart Accessories with snap-in design for convenience and consistency.
- Eliminate manual setup with auto-recognition and software integration of sippers, cells changers, and auto-sampler accessories.
- Take advantage of the Evolution Pro UV-Vis Spectrophotometer’s wide beam separation and large sample compartment, providing flexibility for unique accessories and advanced applications.
Regulatory/Quality Control Environments:
To use the Evolution Pro UV-Vis Spectrophotometer in a regulated or quality control environment, we offer a wide selection of compliance products and services to reduce implementation time and assure system performance.
Evolution Pro Pharma Value Bundles include:
Evolution Pro Spectrometer
INSIGHT Pro with Security Software
Validator for Insight Pro US Ltr or INTL A4 Paper Version
Qualification Filter Kit for UV-Vis
Evolution Pro USP/EP Standards Pharma Bundles include:
Evolution Pro Spectrometer
INSIGHT Pro with Security Software
Validator for Insight Pro US Ltr or INTL A4 Paper Version
USP and EP UV Standards Set
USP and EP Visible Standards Set
Accessory Ordering Information:
All accessories are sold separately. Other accessories include cell changers, cuvette and test holders, calibration carousels, sippers, fiber optic probes, small volume sampling, and accessories for reflectance and rapid mixing.
Specifications
±0.001 A (200 to 800 nm), 2.0 nm SBW, smoothed | |
Silicon Photodiode | |
UV-Vis Spectrophotometer | |
<0.0005 A/hr., 500 nm, 2.0 nm SBW, 2 hr. warmup | |
Academic, Chemicals, Food and Beverage, Chemicals Environmental, Industrial QA/QC, Material Science, Pharmaceuticals | |
<0.00018 A at 0 A; <0.00022 A at 1 A; <0.00050 A at 2 A, 500 nm, 2.0 nm SBW, RMS | |
Wavelength Accuracy: ±0.3 nm 190–900 nm; Wavelength Repeatability: SD 10 meas. <0.1 nm; Absorbance Accuracy: <±0.010 A at 1 A, <±0.010 A at 2 A; Absorbance Repeatability: ±0.0025 A @ 1 A | |
±6 A | |
1 A: ±0.0025 A | |
Variable, up to 6000 nm/min. | |
3-year Source Replacement Warranty | |
10, 5, 2, 1, 0.5, 0.2, 0.1, 0.05 nm |
Evolution Pro UV-Vis Spectrophotometer | |
Pulsed Xenon | |
190 to 1100 nm | |
100/240 V, 50/60 Hz | |
>5 years or longer if not using live signal | |
Modified Ebert, Double beam with sample and reference cuvette/accessory positions | |
1 A: ±0.004 A,2 A: ±0.004 A, 3 A: ±0.006 A, Measured at 440 nm using neutral density filters traceable to NIST | |
>4 A | |
Absorbance, % Transmittance, % Reflectance, Kubelka-Munk, Log(1/R), Log(Abs), ABS × Factor, Intensity, 1st–4th Derivative | |
KCl, 198 nm: ≤0.4% T; NaI, 220 nm: ≤0.032% T; NaNO2, 340 nm: <0.01% T | |
±0.20 nm (546.07 nm Hg emission line), ±0.30 nm, 190 to 900 nm | |
Standard deviation of 10 measurements <0.05 nm |
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